Author |
Jun Ha Lee1, Hoong Joo Lee1, Jeong Won Kang2,*, Oh Keun Kwon3,Young Jin Song4, Young Sik Yoon5,
Ho Jung Hwang2,*
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1. Department of Computer System Engineering, Sangmyung University, Chungnam 330-720, Republic of Korea;
2. School of Electrical and Electronic Engineering, Chung-Ang University, Seoul 156-756, Republic of Korea;
3. Department of Internet Information, Semyung University, Jecheon 390-711, Republic of Korea;
4. Department of Electronic Information Engineering, Konyang University, Republic of Korea;
5. Department of Mechanical Engineering, Konyang University, Republic of Korea.
Received date: December 1, 2006
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Keywords: |
nanoelectromechanical memory, NEMS, nanotube random access memory, NRAM, carbon nanotube, molecular dynamics |
| Abstract |
Nanoelectromechanical model based on classical molecular dynamics method was combined with continuum electric models including charge transfer model to apply dual-gate nanoelectromechanical nanotube memory that could be characterized by carbon nanotube bending performance by both atomistic capacitive and interatomic forces. We performed molecular dynamics simulations for a suspended (5,5) nanotube with the length of 11.567 nm (LCNT) and the separation length of 0.9 ~ 1.5 nm (H). After the nanotube collided on the gold surface, the nanotube oscillated on the gold surface with amplitude of ~1 À, and the amplitude gradually decreased. When H ¡Ü1.3 nm, the nanotube-bridge continually contacted with the gold surface after the first collision. As H increased, the threshold voltage linearly increased. When H /LCNT was below 0.13, the electromechanical nanotube memories were nonvolatile memory devices, whereas the electromechanical nanotube memories were volatile memories or switching devices when H /LCNT was above 0.14. |