Title
Classical molecular dynamics modeling for electromechanical carbon nanotube memory
Author
Jun Ha Lee1, Hoong Joo Lee1, Jeong Won Kang2,*, Oh Keun Kwon3,Young Jin Song4, Young Sik Yoon5,
Ho Jung Hwang2,*
Institute
1. Department of Computer System Engineering, Sangmyung University, Chungnam 330-720, Republic of Korea;
2. School of Electrical and Electronic Engineering, Chung-Ang University, Seoul 156-756, Republic of Korea;
3. Department of Internet Information, Semyung University, Jecheon 390-711, Republic of Korea;
4. Department of Electronic Information Engineering, Konyang University, Republic of Korea;
5. Department of Mechanical Engineering, Konyang University, Republic of Korea. Received date: December 1, 2006
Keywords:
nanoelectromechanical memory, NEMS, nanotube random access memory, NRAM, carbon nanotube, molecular dynamics
Abstract

Nanoelectromechanical model based on classical molecular dynamics method was combined with continuum electric models including charge transfer model to apply dual-gate nanoelectromechanical nanotube memory that could be characterized by carbon nanotube bending performance by both atomistic capacitive and interatomic forces. We performed molecular dynamics simulations for a suspended (5,5) nanotube with the length of 11.567 nm (LCNT) and the separation length of 0.9 ~ 1.5 nm (H). After the nanotube collided on the gold surface, the nanotube oscillated on the gold surface with amplitude of ~1 À, and the amplitude gradually decreased. When H ¡Ü1.3 nm, the nanotube-bridge continually contacted with the gold surface after the first collision. As H increased, the threshold voltage linearly increased. When H /LCNT was below 0.13, the electromechanical nanotube memories were nonvolatile memory devices, whereas the electromechanical nanotube memories were volatile memories or switching devices when H /LCNT was above 0.14.

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